204 lines
7.8 KiB
C++
204 lines
7.8 KiB
C++
//=======================================================================
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// SystemDataTest: SystemData 的故障检测逻辑（断路器映射、绝缘、电源失电、
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// 漏水、DCDC、继电器位提取、缩放、故障码集合、漏水位）。
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// 不改动生产代码；仅链接现有 systemData.h + SQLite + MOOS。
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//=======================================================================
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#include <gtest/gtest.h>
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#include "MOOS/libMOOS/Utils/MOOSUtilityFunctions.h" // MOOSTime (updateCommonStatus)
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#include "systemData.h"
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#include "faultCode.h"
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TEST(SystemDataTest, BreakerMapping)
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{
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SystemData sd;
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unsigned char status = 0;
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// 0x55 = 闭合(1)，无故障码
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sd.updateBreakerFault(status, 0x55, 99);
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EXPECT_EQ(status, 1u);
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EXPECT_EQ(sd.disSysFaultCode.count(99), 0u);
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// 0xAA = 断开(0)，无故障码
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sd.updateBreakerFault(status, 0xAA, 99);
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EXPECT_EQ(status, 0u);
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EXPECT_EQ(sd.disSysFaultCode.count(99), 0u);
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// 0x5A = 故障脱扣(2)，插入故障码
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sd.updateBreakerFault(status, 0x5A, 99);
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EXPECT_EQ(status, 2u);
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EXPECT_EQ(sd.disSysFaultCode.count(99), 1u);
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// 再次正常后擦除
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sd.updateBreakerFault(status, 0x55, 99);
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EXPECT_EQ(sd.disSysFaultCode.count(99), 0u);
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}
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TEST(SystemDataTest, HighVolBusFaultDetection)
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{
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SystemData sd;
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disHighVolBusState s{};
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// 全 0xAA（断开，正常）
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s.fuelCellCircuitBreaker = 0xAA;
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s.powerLithiumBatteryCircuitBreaker = 0xAA;
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s.propulsionMotorCircuitBreaker = 0xAA;
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s.lithiumBatteryGroupInstrumentCircuitBreaker = 0xAA;
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s.dcDc5ModuleCircuitBreaker = 0xAA;
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s.bowHighVoltageDistributionBoxCircuitBreaker = 0xAA;
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s.sternFTDevice45CircuitBreaker = 0xAA;
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s.sternRudderSwitch1CircuitBreaker = 0xAA;
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s.sternRudderSwitch2CircuitBreaker = 0xAA;
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s.powerBusInsulationStatus = 0x55;
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s.aBusInsulationStatus = 0x55;
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s.meterPowerLossSignal = 0x55;
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s.emergencyPowerLossSignal = 0x55;
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sd.updateSystemData(s);
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EXPECT_EQ(sd.power_bus_status.fuelCellCircuitBreaker, 0u);
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EXPECT_EQ(sd.disSysFaultCode.count(1), 0u);
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// 燃料电断路器故障脱扣
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s.fuelCellCircuitBreaker = 0x5A;
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sd.updateSystemData(s);
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EXPECT_EQ(sd.power_bus_status.fuelCellCircuitBreaker, 2u);
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EXPECT_EQ(sd.disSysFaultCode.count(1), 1u);
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// 动力锂电池闭合 + A汇流排/动力母排绝缘低 → 34/35
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s.fuelCellCircuitBreaker = 0xAA;
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s.powerLithiumBatteryCircuitBreaker = 0x55;
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s.powerBusInsulationStatus = 0xAA;
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s.aBusInsulationStatus = 0xAA;
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sd.updateSystemData(s);
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EXPECT_EQ(sd.disSysFaultCode.count(34), 1u);
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EXPECT_EQ(sd.disSysFaultCode.count(35), 1u);
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EXPECT_EQ(sd.power_bus_status.powerBusInsulationStatus, 1u);
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EXPECT_EQ(sd.power_bus_status.aBusInsulationStatus, 1u);
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// 电源失电 → 36/37
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s.meterPowerLossSignal = 0xAA;
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s.emergencyPowerLossSignal = 0xAA;
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sd.updateSystemData(s);
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EXPECT_EQ(sd.disSysFaultCode.count(36), 1u);
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EXPECT_EQ(sd.disSysFaultCode.count(37), 1u);
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// 全部恢复正常后故障码擦除
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s.powerLithiumBatteryCircuitBreaker = 0xAA;
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s.powerBusInsulationStatus = 0x55;
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s.aBusInsulationStatus = 0x55;
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s.meterPowerLossSignal = 0x55;
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s.emergencyPowerLossSignal = 0x55;
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sd.updateSystemData(s);
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EXPECT_EQ(sd.disSysFaultCode.count(34), 0u);
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EXPECT_EQ(sd.disSysFaultCode.count(35), 0u);
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EXPECT_EQ(sd.disSysFaultCode.count(36), 0u);
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EXPECT_EQ(sd.disSysFaultCode.count(37), 0u);
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}
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TEST(SystemDataTest, HighAVolBusFaultDetection)
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{
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SystemData sd;
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disHighAVolBusState s{};
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s.actuatorCircuitBreaker = 0x5A; // 启闭机构断路器脱扣 → 14
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s.xczCircuitBreaker = 0x55;
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s.instrumentPowerFailureSignal = 0x55;
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s.emergencyPowerFailureSignal = 0x55;
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s.waterIngressionAlarm = 0x55;
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sd.updateSystemData(s);
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EXPECT_EQ(sd.power_a_bus_status.actuatorCircuitBreaker, 2u);
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EXPECT_EQ(sd.disSysFaultCode.count(14), 1u);
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s.actuatorCircuitBreaker = 0xAA;
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s.instrumentPowerFailureSignal = 0xAA; // 失电 → 38
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s.emergencyPowerFailureSignal = 0xAA; // 失电 → 39
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s.waterIngressionAlarm = 0xAA; // 浸水 → leakStatus[BOW_HIGH_VOLTAGE]
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sd.updateSystemData(s);
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EXPECT_EQ(sd.disSysFaultCode.count(14), 0u);
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EXPECT_EQ(sd.disSysFaultCode.count(38), 1u);
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EXPECT_EQ(sd.disSysFaultCode.count(39), 1u);
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EXPECT_TRUE(sd.leakStatus[SystemData::LEAKAGE_BOW_HIGH_VOLTAGE]);
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}
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TEST(SystemDataTest, LowMainBusFaultDetection)
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{
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SystemData sd;
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disLowMainBusState s{};
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s.lithiumBatteryGroupInstrumentCircuitBreaker = 0x5A; // 19
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s.unit4InstrumentDC48VCircuitBreaker = 0x5A; // 21
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s.instrumentPowerFailureSignal = 0xAA; // 41
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s.emergencyPowerFailureSignal = 0xAA; // 42
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s.instrumentBusbarInsulationLow = 0xAA; // 43
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sd.updateSystemData(s);
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EXPECT_EQ(sd.disSysFaultCode.count(19), 1u);
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EXPECT_EQ(sd.disSysFaultCode.count(21), 1u);
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EXPECT_EQ(sd.disSysFaultCode.count(41), 1u);
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EXPECT_EQ(sd.disSysFaultCode.count(42), 1u);
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EXPECT_EQ(sd.disSysFaultCode.count(43), 1u);
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}
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TEST(SystemDataTest, LowBusFaultDetection)
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{
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SystemData sd;
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disLowBusState s{};
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s.unit1CircuitBreaker = 0x5A; // 26
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s.emergencyLithiumBatteryGroup1CircuitBreaker = 0x5A; // 33
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s.powerFailureSignal = 0xAA; // 44
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s.emergencyPowerFailureSignal = 0xAA; // 45
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s.waterIngressionAlarm = 0xAA; // leakage BOW_LOW_VOLTAGE
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sd.updateSystemData(s);
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EXPECT_EQ(sd.disSysFaultCode.count(26), 1u);
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EXPECT_EQ(sd.disSysFaultCode.count(33), 1u);
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EXPECT_EQ(sd.disSysFaultCode.count(44), 1u);
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EXPECT_EQ(sd.disSysFaultCode.count(45), 1u);
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EXPECT_TRUE(sd.leakStatus[SystemData::LEAKAGE_BOW_LOW_VOLTAGE]);
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}
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TEST(SystemDataTest, CcuStateScalingAndRelayBits)
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{
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SystemData sd;
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ccuState c{};
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c.ins_soc = 60;
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c.dyn_soc = 80;
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c.ins_relay_status1 = 0x12; // 高4位=1(充电), 低4位=2(正极)
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c.ins_relay_status2 = 0x34;
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c.ins_voltage_link = 4800; // ×0.1 = 480.0
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c.ins_water_leak_dcdc_status = 0x11; // 高4位=1 漏水, 低4位=1 DCDC故障
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c.dyn_water_leak_status = 0x21; // 高4位=2, 低4位=1
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sd.updateSystemData(c);
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EXPECT_EQ(sd.ins_soc, 60);
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EXPECT_EQ(sd.dyn_soc, 80);
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EXPECT_EQ(sd.ins_pos_relay_status, 2u); // 低4位
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EXPECT_EQ(sd.ins_charge_relay_status, 1u); // 高4位
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EXPECT_EQ(sd.ins_precharge_relay_status, 4u); // 低4位 of status2
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EXPECT_EQ(sd.ins_neg_relay_status, 3u); // 高4位 of status2
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EXPECT_NEAR(sd.ins_voltage_link, 480.0, 0.01);
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EXPECT_EQ(sd.water_leak_status_from_insbat, 1u);
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EXPECT_EQ(sd.dcdc_status_from_insbat, 1u);
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EXPECT_TRUE(sd.leakStatus[SystemData::LEAKAGE_LI_BATTERY]);
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}
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TEST(SystemDataTest, FaultCodeSetAndLevel)
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{
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SystemData sd;
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EXPECT_EQ(sd.getFaultCodeLevel(), 0u);
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sd.insertFaultCode(0x1102); // 0x11>>... level = (0x1102>>8)&0xF = 1
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EXPECT_EQ(sd.getFaultCodeLevel(), 1u);
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sd.insertFaultCode(0x4402); // level = (0x4402>>8)&0xF = 4
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EXPECT_EQ(sd.getFaultCodeLevel(), 4u);
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sd.eraseFaultCode(0x4402);
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EXPECT_EQ(sd.getFaultCodeLevel(), 1u);
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auto codes = sd.getFaultCode();
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EXPECT_EQ(codes.count(0x1102), 1u);
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}
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TEST(SystemDataTest, LeakageCodeGeneration)
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{
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SystemData sd;
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EXPECT_EQ(sd.generateLeakageCode(), 0u);
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sd.leakStatus[SystemData::LEAKAGE_BOW_EMERGENCY] = true; // 0x01
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sd.leakStatus[SystemData::LEAKAGE_FUEL_CELL] = true; // 0x08
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sd.leakStatus[SystemData::LEAKAGE_LI_BATTERY] = true; // 0x10
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EXPECT_EQ(sd.generateLeakageCode(), 0x19u);
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}
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TEST(SystemDataTest, CommonStatusTimeout)
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{
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SystemData sd;
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sd.updateCommonStatus(30.0);
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// 新建 SystemData 的 lastUpdateTime=0，与当前 MOOSTime 之差远大于 30s
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EXPECT_TRUE(sd.device_common_status.ccu_status.isTimeout);
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}
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